Ngaderman, Hubertus, and Ego Srivajawaty Sinaga. “Model of Metal-Oxide-Semiconductor Contact Characteristics and Carrier Impurity Concentration in Depletion and Oxide Regions”. Jurnal Fisika Papua 3, no. 2 (August 26, 2024): 64–70. Accessed October 23, 2024. https://ejurnal.fmipa.uncen.ac.id/index.php/visika/article/view/196.